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        當前位置:首頁>會計知識> 原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012

        原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012

        原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012:Designation: D5470 – 12 An American National StandardStand

        Designation: D5470 – 12 An American National Standard

        Standard Test Method for

        Thermal Transmission Properties of Thermally Conductive

        Electrical Insulation Materials1

        This standard is issued under the fixed designation D5470; the number immediately following the designation indicates the year of

        original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A

        superscript epsilon (´) indicates an editorial change since the last revision or reapproval.

        This standard has been approved for use by agencies of the Department of Defense.

        1. Scope*

        1.1 This standard covers a test method for measurement of

        thermal impedance and calculation of an apparent thermal

        conductivity for thermally conductive electrical insulation

        materials ranging from liquid compounds to hard solid materials.

        1.2 The term “thermal conductivity” applies only to homogeneous

        materials. Thermally conductive electrical insulating

        materials are usually heterogeneous and to avoid confusion this

        test method uses “apparent thermal conductivity” for determining

        thermal transmission properties of both homogeneous and

        heterogeneous materials.

        1.3 The values stated in SI units are to be regarded as

        standard.

        1.4 This standard does not purport to address all of the

        safety concerns, if any, associated with its use. It is the

        responsibility of the user of this standard to establish appropriate

        safety and health practices and determine the applicability

        of regulatory limitations prior to use.

        2. Referenced Documents

        2.1 ASTM Standards:2

        D374 Test Methods for Thickness of Solid Electrical Insulation

        E691 Practice for Conducting an Interlaboratory Study to

        Determine the Precision of a Test Method

        E1225 Test Method for Thermal Conductivity of Solids by

        Means of the Guarded-Comparative-Longitudinal Heat

        Flow Technique

        3. Terminology

        3.1 Definitions of Terms Specific to This Standard:

        3.1.1 apparent thermal conductivity (l), n—the time rate of

        heat flow, under steady conditions, through unit area of a

        heterogeneous material, per unit temperature gradient in the

        direction perpendicular to the area.

        3.1.2 average temperature (of a surface), n—the areaweighted

        mean temperature.

        3.1.3 composite, n—a material made up of distinct parts

        which contribute, either proportionally or synergistically, to the

        properties of the combination.

        3.1.4 homogeneous material, n—a material in which relevant

        properties are not a function of the position within the

        material.

        3.1.5 thermal impedance (u), n—the total opposition that an

        assembly (material, material interfaces) presents to the flow of

        heat.

        3.1.6 thermal interfacial resistance (contact resistance),

        n—the temperature difference required to produce a unit of

        heat flux at the contact planes between the specimen surfaces

        and the hot and cold surfaces in contact with the specimen

        under test. The symbol for contact resistance is RI.

        3.1.7 thermal resistivity, n—the reciprocal of thermal conductivity.

        Under steady-state conditions, the temperature gradient,

        in the direction perpendicular to the isothermal surface

        per unit of heat flux.

        3.2 Symbols Used in This Standard:

        3.2.1 l = apparent thermal conductivity, W/m·K.

        3.2.2 A = area of a specimen, m2.

        3.2.3 d = thickness of specimen, m.

        3.2.4 Q = time rate of heat flow, W or J/s.

        3.2.5 q = heat flux, or time rate of heat flow per unit area,

        W/m2.

        3.2.6 u = thermal impedance, temperature difference per

        unit of heat flux, (K·m2)/W.

        4. Summary of Test Method

        4.1 This standard is based on idealized heat conduction

        between two parallel, isothermal surfaces separated by a test

        specimen of uniform thickness. The thermal gradient imposed

        on the specimen by the temperature difference between the two

        contacting surfaces causes the heat flow through the specimen.

        This heat flow is perpendicular to the test surfaces and is

        uniform across the surfaces with no lateral heat spreading.

        1 This test method is under the jurisdiction of ASTM Committee D09 on

        Electrical and Electronic Insulating Materials and is the direct responsibility of

        Subcommittee D09.19 on Dielectric Sheet and Roll Products.

        Current edition approved Jan. 1, 2012. Published February 2012. Originally

        approved in 1993. Last previous edition approved in 2011 as D5470 – 11. DOI:

        10.1520/D5470-12.

        2 For referenced ASTM standards, visit the ASTM website, , or

        contact ASTM Customer Service at service. For Annual Book of ASTM

        Standards volume information, refer to the standard’s Document Summary page on

        the ASTM website.

        1

        *A Summary of Changes section appears at the end of this standard.

        Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.

        原ASTM D5470-2006薄的熱導性固體電絕緣材料傳熱性能的測試標準先更新為ASTM D5470-2012

        Copyright ASTM International

        Provided by IHS under license with ASTM

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        4.2 The measurements required by this standard when using

        two meter bars are:

        T1 = hotter temperature of the hot meter bar, K,

        T2 = colder temperature of the hot meter bar, K,

        T3 = hotter temperature of the cold meter bar, K,

        T4 = colder temperature of the cold meter bar, K,

        A = area of the test surfaces, m2, and

        d = specimen thickness, m.

        4.3 Based on the idealized test configuration, measurements

        are taken to compute the following parameters:

        TH = the temperature of the hotter isothermal surface, K,

        TC = the temperature of the colder isothermal surface, K,

        Q = the heat flow rate between the two isothermal surfaces,

        W,

        thermal impedance = the temperature difference between the

        two isothermal surfaces pided by the heat flux through them,

        K·m2/W, and

        apparent thermal conductivity = calculated from a plot of

        specimen thermal impedance versus thickness, W/m·K.

        4.4 Interfacial thermal resistance exists between the specimen

        and the test surfaces. These contact resistances are

        included in the specimen thermal impedance computation.

        Contact resistance varies widely depending on the nature of the

        specimen surface and the mechanical pressure applied to the

        specimen by the test surfaces. The clamping pressure applied to

        the specimen should therefore be measured and recorded as a

        secondary measurement required for the method except in the

        case of fluidic samples (Type I, see section 5.3.1) where the

        applied pressure is insignificant. The computation for thermal

        impedance is comprised of the sum of the specimen thermal

        resistance plus the interfacial thermal resistance.

        4.5 Calculation of apparent thermal conductivity requires an

        accurate determination of the specimen thickness under test.

        Different means can be used to control, monitor, and measure

        the test specimen thickness depending on the material type.

        4.5.1 The test specimen thickness under test can be controlled

        with shims or mechanical stops if the dimension of the

        specimen can change during the test.

        4.5.2 The test specimen thickness can be monitored under

        test with an in situ thickness measurement if the dimension of

        the specimen can change during the test.

        4.5.3 The test specimen thickness can be measured as

        manufactured at room temperature in accordance with Test

        Methods D374 Test Method C if it exhibits negligible compression

        deflection.

        5. Significance and Use

        5.1 This standard measures the steady state thermal impedance

        of electrical insulating materials used to enhance heat

        transfer in electrical and electronic applications. This standard

        is especially useful for measuring thermal transmission properties

        of specimens that are either too thin or have insufficient

        mechanical stability to allow placement of temperature sensors

        in the specimen as in Test Method E1225.

        5.2 This standard imposes an idealized heat flow pattern and

        specifies an average specimen test temperature. The thermal

        impedances thus measured cannot be directly applied to most

        practical applications where these required uniform, parallel

        heat conduction conditions do not exist.

        5.3 This standard is useful for measuring the thermal

        impedance of the following material types.

        5.3.1 Type I—Viscous liquids that exhibit unlimited deformation

        when a stress is applied. These include liquid compounds

        such as greases, pastes, and phase change materials.

        These materials exhibit no evidence of elastic behavior or the

        tendency to return to initial shape after deflection stresses are

        removed.

        5.3.2 Type II—Viscoelastic solids where stresses of deformation

        are ultimately balanced by internal material stresses

        thus limiting further deformation. Examples include gels, soft,

        and hard rubbers. These materials exhibit linear elastic properties

        with significant deflection relative to material thickness.

        5.3.3 Type III—Elastic solids which exhibit negligible deflection.

        Examples include ceramics, metals, and some types of

        plastics.

        5.4 The apparent thermal conductivity of a specimen can be

        calculated from the measured thermal impedance and measured

        specimen thickness if the interfacial thermal resistance is

        insignificantly small (nominally less than 1 %) compared to the

        thermal resistance of the specimen.

        5.4.1 The apparent thermal conductivity of a sample material

        can be accurately determined by excluding the interfacial

        thermal resistance. This is accomplished by measuring the

        thermal impedance of different thicknesses of the material

        under test and plotting thermal impedance versus thickness.

        The inverse of the slope of the resulting straight line is the

        apparent thermal conductivity. The intercept at zero thickness

        is the sum of the contact resistances at the two surfaces.

        5.4.2 The contact resistance can be reduced by applying

        thermal grease or oil to the test surfaces of rigid test specimens

        (Type III).

        TEST METHOD

        6. Apparatus

        6.1 The general features of an apparatus that meets the

        requirements of this method are shown in Figs. 1 and 2. This

        apparatus imposes the required test conditions and accomplishes

        the required measurements. It should be considered to

        be one possible engineering solution, not a uniquely exclusive

        implementation.

        6.2 The test surfaces are to be smooth within 0.4 microns

        and parallel to within 5 microns.

        6.3 The heat sources are either electrical heaters or temperature

        controlled fluid circulators. Typical electrical heaters are

        made by embedding wire wound cartridge heaters in a highly

        conductive metal block. Circulated fluid heaters consist of a

        metal block heat exchanger through which a controlled temperature

        fluid is circulated to provide the required heat flow as

        well as temperature control.

        6.4 Heat flow through the specimen can be measured with

        meter bars regardless of the type of heater used.

        6.4.1 Electrical heaters offer convenient measurement of the

        heating power generated but must be combined with a guard

        heater and high quality insulation to limit heat leakage away

        from the primary flow through the specimen.

        D5470 – 12

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        6.4.2 Heat flow meter bars can be constructed from high

        conductivity materials with well documented thermal conductivity

        within the temperature range of interest. The temperature

        sensitivity of thermal conductivity must be considered for

        accurate heat flow measurement. The thermal conductivity of

        the bar material is recommended to be greater than 50 W/m·K.

        6.4.3 Guard heaters are comprised of heated shields around

        the primary heat source to eliminate heat leakage to the

        environment. Guard heaters are insulated from the heat source

        and maintained at a temperature within 60.2 K of the heater.

        This effectively reduces the heat leakage from the primary

        heater by nullifying the temperature difference across the

        insulation. Insulation between the guard heater and the heat

        source should be at least the equivalent of one 5 mm layer of

        FR-4 epoxy material.

        6.4.4 If the heat flow meter bars are used on both the hot and

        cold surfaces, guard heaters and thermal insulation is not

        required and the heat flow through the test specimen is

        computed as the average heat flow through both meter bars.

        6.5 Meter bars can also be used to determine the temperature

        of the test surfaces by extrapolating the linear array of

        meter bar temperatures to the test surfaces. This can be done

        for both the hot side and cold side meter bars. Surface

        temperatures can also be measured with thermocouples that are

        located in extreme proximity to the surfaces although this can

        be mechanically difficult to achieve. Meter bars can be used for

        both heat flow and surface temperature measurement or for

        exclusively one of these functions.

        6.6 The cooling unit is commonly implemented with a metal

        block cooled by temperature controlled circulating fluid with a

        temperature stability of 60.2 K.

        6.7 The contact pressure on the specimen can be controlled

        and maintained in a variety of ways, including linear actuators,

        lead screws, pneumatics, and hydraulics. The desired range of

        forces must be applied to the test fixture in a direction that is

        perpendicular to the test surfaces and maintains the parallelism

        and alignment of the surfaces.

        7. Preparation of Test Specimens

        7.1 The material type will dictate the method for controlling

        specimen thickness. In all cases, prepare specimens of the same

        area as the contacting test surfaces. If the test surfaces are not

        of equal size, prepare the specimen equal to the dimension of

        the smaller test surface.

        FIG. 1 Test Stack Using the Meter Bars as Calorimeters

        FIG. 2 Guarded Heater Test Stack

        D5470 – 12

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        7.1.1 Type I—Use shims or mechanical stops to control the

        thickness of the specimen between the test surfaces. Spacer

        beads of the desired diameter can also be used in approximately

        2 % volumetric ratio and thoroughly mixed into the

        sample prior to being applied to the test surfaces.

        7.1.2 Type II—Use an adjustable clamping pressure to

        deflect the test specimen by 5 % of its uncompressed thickness.

        This represents a trade-off between lower surface contact

        resistance and excessive sample deflection.

        7.1.3 Type III—Measure the sample thickness in accordance

        with Test Method C of Test Methods D374.

        7.2 Prepare specimens from material that is in original,

        as-manufactured condition or as noted otherwise. Remove any

        contamination and dirt particles. Do not use solvent that will

        react with or contaminate the specimens.

        8. Procedure

        8.1 Determination of test specimen thickness.

        8.1.1 Machines with in situ thickness measurement apparatus.

        8.1.1.1 Close the test stack and apply the clamping pressure

        required for the specimen to be tested.

        8.1.1.2 Turn on the heating and cooling units and let

        stabilize at the specified set points to give an average sample

        temperature of 50°C (average of T2 and T3), unless otherwise

        specified.

        8.1.1.3 Zero the thickness measuring device (micrometer,

        LVDT, laser detector, encoder, etc.).

        8.1.2 Machines without an in situ thickness measuring

        apparatus.

        8.1.2.1 At room temperature, measure the specimen thickness

        in accordance with Test Method C of Test Methods D374.

        8.2 Load the specimen on the lower test stack.

        8.2.1 Dispense Type I grease and paste materials onto the

        lower test stack surface. Melt phase change compounds to

        dispense onto the stack.

        8.2.2 Place Type II and III specimens onto the lower test

        stack.

        8.3 Close the test stack and apply clamping pressure.

        8.3.1 Type I materials being tested with shims to control the

        test thickness require only enough pressure to squeeze out

        excess material and contact the shim but not too much pressure

        that will result in the shim damaging the surfaces of the test

        stacks.

        8.3.1.1 For machines with screw stops, electromechanical,

        or hydraulic actuators controlling the position of the upper test

        stack, the magnitude of the clamping pressure is not critical.

        8.3.1.2 Raise the temperature of the test stack above the

        specimen melting point to enable phase change materials to

        flow and permit closing of the test stacks. After the material has

        flowed, return the heating and cooling units to the required set

        points to maintain an average specimen temperature of 50°C

        before beginning the test, unless otherwise specified.

        8.3.2 Type II materials require enough pressure to coalesce

        stacked specimens together and minimize interfacial thermal

        resistances. Too much pressure can damage the specimens.

        This can be as low as 0.069 MPa (10 psi) for softer specimens

        or as high as 3.4 MPa (500 psi) for harder specimens.

        Alternatively, screws or linear actuators can be used to control

        the specimen thickness under test for easily deformable Type II

        materials.

        8.3.3 Type III materials require enough pressure to exclude

        excess thermal grease from the interface and to flatten specimens

        that are not flat. This can be as low as 0.69 MPa (100 psi)

        for flat specimens with low viscosity thermal grease or as high

        as 3.4 MPa (500 psi) for non-flat specimens or when using high

        viscosity thermal grease.

        8.4 Record the temperatures of the meter bars and the

        voltage and current applied to electrical heaters at equilibrium.

        Equilibrium is attained when, at constant power, 2 sets of

        temperature readings taken at 5 minute intervals differ by less

        than 60.1°C, or if the thermal impedance has changed by less

        than 1 % of the current thermal impedance over a 5 minute

        time span.

        8.5 Calculate the mean specimen temperature and the thermal

        impedance. Label the calculated thermal impedance for the

        single-layer specimen as the “thermal impedance” of the

        sample.

        8.6 Determine the thermal impedance of at least 3 specimen

        thicknesses. Maintain the mean temperature of the specimens

        at 50 6 2°C (unless otherwise specified) by reducing the heat

        flux as the specimen thickness is increased.

        8.6.1 For specimens that need to be stacked to get different

        thicknesses, first measure the thermal impedance of one layer

        alone, then measure the thermal impedance of 2 layers stacked

        together, and then measure the thermal impedance of 3 layers

        stacked together.

        8.6.2 For specimens of 3 different thicknesses A, B, and C,

        first measure the thermal impedance of specimen A alone, then

        measure the thermal impedance of specimen B alone, then

        measure the thermal impedance of specimen C alone.

        9. Calculation

        9.1 Heat Flow:

        9.1.1 Heat Flow When Using the Meter Bars For

        Calorimeters—Calculate the heat flow from the meter bar

        readings as follows:

        Q12 5

        l12 3 A

        d 3 @T1 – T2# (1)

        Q34 5

        l34 3 A

        d 3 @T3 – T4# (2)

        Q 5

        Q12 1 Q34

        2 (3)

        where:

        Q12 = heat flow in hot meter bar, W,

        Q34 = heat flow in cold meter bar, W,

        Q = average heat flow through specimen, W,

        l12 = thermal conductivity of the hot meter bar material,

        W/(m·K),

        l34 = thermal conductivity of the cold meter bar material,

        W/(m·K),

        A = area of the reference calorimeter, m2,

        T1 – T2 = temperature difference between temperature sensors

        of the hot meter bar, K,

        T3 – T4 = temperature difference between temperature sensors

        of the cold meter bar, K, and

        D5470 – 12

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        d = distance between temperature sensors in the

        meter bars, m.

        9.1.2 Heat Flow When Not Using the Meter Bars for

        Calorimeters—Calculate the heat flow from the applied electrical

        power as follows:

        Q 5 V 3 I (4)

        where:

        Q = heat flow, W,

        V = electrical potential applied to the heater, V, and

        I = electrical current flow in the heater, A.

        9.2 Derive the temperature of the hot meter bar surface in

        contact with the specimen from the following:

        TH 5 T2 –

        dB

        dA

        3 @T1 – T2# (5)

        where:

        TH = temperature of the hot meter bar surface in contact

        with the specimen, K,

        T1 = warmer temperature of the hot meter bar, K,

        T2 = cooler temperature of the hot meter bar, K,

        dA = distance between T1 and T2, m, and

        dB = distance from T2 to the surface of the hot meter bar in

        contact with the specimen, m.

        9.3 Derive the temperature of the cold meter bar surface in

        contact with the specimen from the following:

        TC 5 T3 1

        dD

        dC

        3 @T3 – T4# (6)

        where:

        TC = temperature of the cold meter bar surface in contact

        with the specimen, K,

        T3 = warmer temperature of the cold meter bar, K,

        T4 = cooler temperature of the cold meter bar, K,

        dC = distance between T3 and T4, m, and

        dD = distance from T3 to the surface of the cold meter bar

        in contact with the specimen, m.

        9.4 Calculate the thermal impedance from Eq 7 and express

        it in units of (K·m2)/W:

        u 5

        A

        Q 3 @TH – TC# (7)

        9.5 Obtain apparent thermal conductivity from a plot of

        thermal impedance for single and multiple layered specimens

        against the respective specimen thickness. Plot values of the

        specimen thickness on the x axis and specimen thermal

        impedance on the y axis.

        9.5.1 The curve is a straight line whose slope is the

        reciprocal of the apparent thermal conductivity. The intercept

        at zero thickness is the thermal interfacial resistance, RI,

        specific to the sample, clamping force used, and the clamping

        surfaces.

        9.5.2 As a preferred alternative, compute the slope and the

        intercept using least mean squares or linear regression analysis.

        10. Report

        10.1 Report the following information:

        10.1.1 Specimen identification:

        10.1.1.1 Name of the manufacturer,

        10.1.1.2 Batch or lot number,

        10.1.1.3 Grade designation,

        10.1.1.4 Nominal thickness, and

        10.1.1.5 Any other information pertinent to the identification

        of the material.

        10.1.2 Number of layers used in the test.

        10.1.3 Average temperature of the specimen, if other than

        323 K.

        10.1.4 Pressure used during testing,

        10.1.5 Thermal transmission properties:

        10.1.5.1 Apparent thermal conductivity from 9.5, and

        10.1.5.2 Thermal impedance from 9.4 (normalized to nominal

        thickness for Type II materials).

        11. Precision and Bias

        11.1 A round robin was conducted on five Type II materials

        having different constructions and thicknesses. Six laboratories

        tested specimens from all of the materials using either the

        specified test method or additional Test Method B of this

        standard, which is now deleted. Table 1, prepared in accordance

        with Practice E691, summarizes the results of the round

        robin. Data obtained during the round-robin testing are being

        made available in a research report.

        11.2 From the data used to generate Table 1 the following

        conclusion is made:

        11.2.1 Thermal conductivity values for the same material

        measured in different laboratories are expected to be within

        18 % of the mean of the values from all of the laboratories.

        11.3 Bias for this test method is currently under investigation

        subject to the availability of a suitable reference material.

        12. Keywords

        12.1 apparent thermal conductivity; guarded heater method;

        thermal conductivity; thermal impedance; thermally conductive

        electrical insulation

        TABLE 1 Precision for Conductivity Measurement

        NOTE 1—Values are in units of watt per meter Kelvin.

        Material Identity Average Sr

        A SR

        B rC RD

        Material B 0.923 0.0383 0.163 0.107 0.456

        Material E 1.245 0.0834 0.175 0.234 0.491

        Material C 1.311 0.0423 0.192 0.119 0.536

        Material A 2.732 0.2010 0.311 0.563 0.872

        Material D 5.445 0.5691 0.711 1.594 1.991

        A Sr = within-laboratory standard deviation of the average.

        B SR = between-laboratories standard deviation of the average.

        C r = within-laboratory repeatability limit = 2.8 3 Sr.

        D R = between-laboratories reproducibility limit = 2.8 3 SR.

        D5470 – 12

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        SUMMARY OF CHANGES

        Committee D09 has identified the location of selected changes to this test method since the last issue,

        D5470 – 01, that may impact the use of this test method. (Approved April 1, 2006)

        (1) The test method was heavily revised throughout to remove

        non-mandatory language and to clarify mandatory aspects in

        the method, apparatus, specimens, and procedures.

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